2009 IEEE Conference on Computer Vision and Pattern Recognition
2009 IEEE Conference on Computer Vision and Pattern Recognition is one of 9,000 studies in the ScholarPulse dataset. Key details — Year: 2009; Field: Industrial Vision Systems and Defect Detection; Times cited: 5560.
| Year | 2009 |
|---|---|
| Field | Industrial Vision Systems and Defect Detection |
| Times cited | 5560 |
| Type | paratext |
| DOI / link | https://doi.org/10.1109/cvpr14067.2009 |