2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition
2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition is one of 9,000 studies in the ScholarPulse dataset. Key details — Year: 2018; Field: Industrial Vision Systems and Defect Detection; Times cited: 4751.
| Year | 2018 |
|---|---|
| Field | Industrial Vision Systems and Defect Detection |
| Times cited | 4751 |
| Type | paratext |
| DOI / link | https://doi.org/10.1109/cvpr40276.2018 |