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Proceedings of IEEE Conference on Computer Vision and Pattern Recognition

Proceedings of IEEE Conference on Computer Vision and Pattern Recognition is one of 9,000 studies in the ScholarPulse dataset. Key details — Year: 1993; Field: Industrial Vision Systems and Defect Detection; Times cited: 14334.

Year1993
FieldIndustrial Vision Systems and Defect Detection
Times cited14334
Typearticle
DOI / linkhttps://doi.org/10.1109/cvpr.1993.341010

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